Microelectronics

Yield and Reliability

An important cost factor in manufacturing of electric and electronic devices is the number of working devices per process batch. Due to high complexity of production, there are a lot of influantial factors to this indicator. The number is also in mastered processes considerably below the maximum possible number and is called “yield”.

Working group Yield and Reliability (former working group Yield Management) was set up in 2011 and targets people that want to improve their production processes. Main emphasis is on exchange of methods (best practices) and information. Also initiation and implementation of joint projects, e.g. within material analysis, methods and tools, is possible.

WORKING GROUP LEADER

Bild der Arbeitskreisleiterin

Ines Thurner
CONVANIT GmbH & Co. KG
+49 157 84 99 92 13
ines.thurner@convanit.com

WORKING GROUP LEADER

Bild Arbeitskreisleiter

Michael Meinel
CONVANIT GmbH & Co. KG
+49 151 55 61 98 99
michael.meinel@convanit.com

Goals:

  • Exchange of information and best practices
  • networking between manufacturing companies
  • Initiation and implementation of joint projects
  • Knowledge and technology transfer

Target group of the working group

  • Manufacturers of semiconductors, sensors, electronic devices and solar cells.
  • engineers
  • quality managers
  • ic designers

Added value of the working group

  • increase of production quality
  • improvements within yield and reliablity
  • faster and more efficient development of new products

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