41st Chemnitz Seminar

Test and Reliability Solutions – New opportunities for electronic components and systems

The 41st Chemnitz Seminar is held under the title “Test and Reliability Solutions - New solutions for electronic components and systems”.

Latest test and reliability methods not only ensure the highest quality and durability of semiconductor products, but also accelerate innovations in microelectronic components and systems by reducing development times. In Chemnitz, the expertise of both areas is combined to create a unique ecosystem for cross-industry test solutions and reliability assessments.

That is why we would like to discuss various topics from the fields of testing and reliability with you. During the two-day seminar we have invited experts from industry and science to a varied program of lectures. In addition to the presentations, we will show a poster exhibition and invite you to bilateral meetings as well as offer sufficient space for exchange and networking for all participants.

The sessions will cover the following topics:

• Test methodology
• MEMS test
• Power test
• Reliability - Design for Reliability and Prognostic Health Management
• AI/Data