{"id":539560,"date":"2026-03-24T12:58:51","date_gmt":"2026-03-24T11:58:51","guid":{"rendered":"https:\/\/silicon-saxony.de\/a-new-level-of-thin-film-characterisation-is-within-reach\/"},"modified":"2026-03-24T12:59:22","modified_gmt":"2026-03-24T11:59:22","slug":"a-new-level-of-thin-film-characterisation-is-within-reach","status":"publish","type":"post","link":"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/","title":{"rendered":"Fraunhofer IPMS: A new level of thin-film characterisation is within reach"},"content":{"rendered":"<p>Fraunhofer IPMS recently presented new chips and measurement adapters for characterizing thin films of materials used in organic electronics and gas sensors. Building on this, the publicly funded project SMut has been launched, in which Fraunhofer IPMS and its partners Credoxys and SweepMe! are pooling their expertise to develop a novel measurement system.\n<\/p>\n<\/p>\n<p><\/p>\n<p>This innovative system will comprise a base station and multiple sample carriers that can be loaded with research samples in a glovebox. This will enable various electrical and photoelectric experiments to be conducted under different gases, pressures and temperatures. &#8220;The sample carrier should be easy to handle in a glovebox, removable under protective gas and capable of long-term measurements over several weeks,&#8221; explains Dr Alexander Graf, project manager at Fraunhofer IPMS.\n<\/p>\n<p><\/p>\n<p>Thanks to SweepMe!&#8217;s software development, almost any measuring device and routine can now be configured intuitively. &#8220;This project&#8217;s software solution will enable an intuitive, out-of-the-box characterization platform for the first time,&#8221; says Dr. Axel Fischer, SweepMe! GmbH&#8217;s managing director, summarizing the project goals.\n<\/p>\n<p><\/p>\n<p>Dr. J\u00f6rn Vahland, a materials developer at Credoxys GmbH, is enthusiastic about the new possibilities that the measurement system will offer. \u201cThe effort we currently put into characterizing our OLED materials is enormous. Long-term measurements under controlled atmosphere and temperature conditions are particularly challenging at present. This system will take thin-film characterization to a whole new level. The reproducibility and measurement capabilities are sensational.&#8221;\n<\/p>\n<p><\/p>\n<p>The basic concept and the fundamental system design will be presented to interested visitors at the Fraunhofer IPMS booth at Analytica, which can be found in Hall A3#312. Individual appointments can be arranged in advance via the Fraunhofer IPMS website.\n<\/p>\n<p><\/p>\n<p>Funding for this project is provided by the European Regional Development Fund (ERDF) and by public tax revenues in accordance with the budget approved by the Saxon State Parliament.<\/p>\n<p><\/p>\n<p>Franka Balvin (Redaktion)<\/p>\n<p>Fraunhofer-Institut f\u00fcr Photonische Mikrosysteme IPMS\n<\/p>\n<p>Maria-Reiche-Str. 2\n<\/p>\n<p>01109 Dresden<\/p>\n<p>Telefon: +49 351 8823-1144<\/p>\n<p>\ud83d\udc49<a href=\"https:\/\/www.ipms.fraunhofer.de\/en\/press-media\/press\/2026\/New-level-of-thin-film-characterization.html\" target=\"_blank\">Press Release<\/a><\/p>\n<\/p>\n<\/p><\/p>\n","protected":false},"excerpt":{"rendered":"<p>The Fraunhofer Institute for Photonic Microsystems IPMS has launched the publicly funded SMut project, in collaboration with its partners Credoxys and SweepMe! to develop an innovative measurement system for precise thin-film characterization. This system will enable experiments to be conducted under variable conditions, setting new standards in the characterization of organic materials.<\/p>\n","protected":false},"author":3,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"inline_featured_image":false,"footnotes":"","_links_to":"","_links_to_target":""},"categories":[4818],"tags":[1951,152,142,1959,2011,2015],"class_list":["post-539560","post","type-post","status-publish","format-standard","hentry","category-microelectronics","tag-elektronik","tag-foerderung","tag-forschung-entwicklung","tag-halbleiter","tag-prozesstechnologien","tag-softwareentwicklung"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.1.1 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Fraunhofer IPMS: A new level of thin-film characterisation is within reach - Silicon Saxony<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Fraunhofer IPMS: A new level of thin-film characterisation is within reach - Silicon Saxony\" \/>\n<meta property=\"og:description\" content=\"The Fraunhofer Institute for Photonic Microsystems IPMS has launched the publicly funded SMut project, in collaboration with its partners Credoxys and SweepMe! to develop an innovative measurement system for precise thin-film characterization. This system will enable experiments to be conducted under variable conditions, setting new standards in the characterization of organic materials.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/\" \/>\n<meta property=\"og:site_name\" content=\"Silicon Saxony\" \/>\n<meta property=\"article:published_time\" content=\"2026-03-24T11:58:51+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2026-03-24T11:59:22+00:00\" \/>\n<meta name=\"author\" content=\"publizer2silisax\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"publizer2silisax\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/#article\",\"isPartOf\":{\"@id\":\"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/\"},\"author\":{\"name\":\"publizer2silisax\",\"@id\":\"https:\/\/silicon-saxony.de\/en\/#\/schema\/person\/098cd473f5dd7707320dd1e252e15ac6\"},\"headline\":\"Fraunhofer IPMS: A new level of thin-film characterisation is within reach\",\"datePublished\":\"2026-03-24T11:58:51+00:00\",\"dateModified\":\"2026-03-24T11:59:22+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/\"},\"wordCount\":330,\"keywords\":[\"Elektronik\",\"F\u00f6rderung\",\"Forschung &amp; Entwicklung\",\"Halbleiter\",\"Prozesstechnologien\",\"Softwareentwicklung\"],\"articleSection\":[\"Microelectronics\"],\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/\",\"url\":\"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/\",\"name\":\"Fraunhofer IPMS: A new level of thin-film characterisation is within reach - Silicon Saxony\",\"isPartOf\":{\"@id\":\"https:\/\/silicon-saxony.de\/en\/#website\"},\"datePublished\":\"2026-03-24T11:58:51+00:00\",\"dateModified\":\"2026-03-24T11:59:22+00:00\",\"author\":{\"@id\":\"https:\/\/silicon-saxony.de\/en\/#\/schema\/person\/098cd473f5dd7707320dd1e252e15ac6\"},\"breadcrumb\":{\"@id\":\"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/silicon-saxony.de\/en\/home\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Fraunhofer IPMS: A new level of thin-film characterisation is within reach\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/silicon-saxony.de\/en\/#website\",\"url\":\"https:\/\/silicon-saxony.de\/en\/\",\"name\":\"Silicon Saxony\",\"description\":\"Germany&#039;s Hightech Network - Semiconductors, Software, Robotics\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/silicon-saxony.de\/en\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Person\",\"@id\":\"https:\/\/silicon-saxony.de\/en\/#\/schema\/person\/098cd473f5dd7707320dd1e252e15ac6\",\"name\":\"publizer2silisax\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/silicon-saxony.de\/en\/#\/schema\/person\/image\/\",\"url\":\"https:\/\/secure.gravatar.com\/avatar\/c4acbd63e28aa0bc7909adc90d5ef38c3fdb5e4c7922782d8eca389d00ffbd0d?s=96&d=mm&r=g\",\"contentUrl\":\"https:\/\/secure.gravatar.com\/avatar\/c4acbd63e28aa0bc7909adc90d5ef38c3fdb5e4c7922782d8eca389d00ffbd0d?s=96&d=mm&r=g\",\"caption\":\"publizer2silisax\"},\"url\":\"https:\/\/silicon-saxony.de\/en\/author\/publizer2silisax\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Fraunhofer IPMS: A new level of thin-film characterisation is within reach - Silicon Saxony","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/","og_locale":"en_US","og_type":"article","og_title":"Fraunhofer IPMS: A new level of thin-film characterisation is within reach - Silicon Saxony","og_description":"The Fraunhofer Institute for Photonic Microsystems IPMS has launched the publicly funded SMut project, in collaboration with its partners Credoxys and SweepMe! to develop an innovative measurement system for precise thin-film characterization. This system will enable experiments to be conducted under variable conditions, setting new standards in the characterization of organic materials.","og_url":"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/","og_site_name":"Silicon Saxony","article_published_time":"2026-03-24T11:58:51+00:00","article_modified_time":"2026-03-24T11:59:22+00:00","author":"publizer2silisax","twitter_card":"summary_large_image","twitter_misc":{"Written by":"publizer2silisax","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/#article","isPartOf":{"@id":"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/"},"author":{"name":"publizer2silisax","@id":"https:\/\/silicon-saxony.de\/en\/#\/schema\/person\/098cd473f5dd7707320dd1e252e15ac6"},"headline":"Fraunhofer IPMS: A new level of thin-film characterisation is within reach","datePublished":"2026-03-24T11:58:51+00:00","dateModified":"2026-03-24T11:59:22+00:00","mainEntityOfPage":{"@id":"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/"},"wordCount":330,"keywords":["Elektronik","F\u00f6rderung","Forschung &amp; Entwicklung","Halbleiter","Prozesstechnologien","Softwareentwicklung"],"articleSection":["Microelectronics"],"inLanguage":"en-US"},{"@type":"WebPage","@id":"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/","url":"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/","name":"Fraunhofer IPMS: A new level of thin-film characterisation is within reach - Silicon Saxony","isPartOf":{"@id":"https:\/\/silicon-saxony.de\/en\/#website"},"datePublished":"2026-03-24T11:58:51+00:00","dateModified":"2026-03-24T11:59:22+00:00","author":{"@id":"https:\/\/silicon-saxony.de\/en\/#\/schema\/person\/098cd473f5dd7707320dd1e252e15ac6"},"breadcrumb":{"@id":"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/silicon-saxony.de\/en\/a-new-level-of-thin-film-characterisation-is-within-reach\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/silicon-saxony.de\/en\/home\/"},{"@type":"ListItem","position":2,"name":"Fraunhofer IPMS: A new level of thin-film characterisation is within reach"}]},{"@type":"WebSite","@id":"https:\/\/silicon-saxony.de\/en\/#website","url":"https:\/\/silicon-saxony.de\/en\/","name":"Silicon Saxony","description":"Germany&#039;s Hightech Network - Semiconductors, Software, Robotics","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/silicon-saxony.de\/en\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Person","@id":"https:\/\/silicon-saxony.de\/en\/#\/schema\/person\/098cd473f5dd7707320dd1e252e15ac6","name":"publizer2silisax","image":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/silicon-saxony.de\/en\/#\/schema\/person\/image\/","url":"https:\/\/secure.gravatar.com\/avatar\/c4acbd63e28aa0bc7909adc90d5ef38c3fdb5e4c7922782d8eca389d00ffbd0d?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/c4acbd63e28aa0bc7909adc90d5ef38c3fdb5e4c7922782d8eca389d00ffbd0d?s=96&d=mm&r=g","caption":"publizer2silisax"},"url":"https:\/\/silicon-saxony.de\/en\/author\/publizer2silisax\/"}]}},"_links":{"self":[{"href":"https:\/\/silicon-saxony.de\/en\/wp-json\/wp\/v2\/posts\/539560","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/silicon-saxony.de\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/silicon-saxony.de\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/silicon-saxony.de\/en\/wp-json\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/silicon-saxony.de\/en\/wp-json\/wp\/v2\/comments?post=539560"}],"version-history":[{"count":0,"href":"https:\/\/silicon-saxony.de\/en\/wp-json\/wp\/v2\/posts\/539560\/revisions"}],"wp:attachment":[{"href":"https:\/\/silicon-saxony.de\/en\/wp-json\/wp\/v2\/media?parent=539560"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/silicon-saxony.de\/en\/wp-json\/wp\/v2\/categories?post=539560"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/silicon-saxony.de\/en\/wp-json\/wp\/v2\/tags?post=539560"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}